Quantify Beam Sensitive Samples Easily and Accurately
By extrapolating x-ray intensity changes over time using our unique quadratic or exponential regressions in log space, an accurate estimation of the zero time X-ray intensities are possible for beam sensitive materials such as glasses, carbonates and hydrous minerals, even for situations in which the time dependent intensity (TDI) corrections are over 100%.
- The TDI element correction is an essential feature to correct for any element whose intensity varies in time, whether due to ion migration or actual volatilization, and is applied during the matrix correction for ultimate accuracy.
- Graphically display all intensity changes, while the program automatically calculates the zero time intensity.
- Turn the TDI correction on or off with a single mouse click for all elements or selected elements.
This improved “volatile element” correction is applied iteratively during the matrix correction for maximum accuracy along with the spectral interference, area peak shape factor and oxygen equivalent of halogen corrections.
The quantitative TDI correction is available using both user “assigned” or automatic “self” calibrations, with linear, quadratic or exponential extrapolation to zero time.
These are just a few of the many unique quantitative features available in Probe for EPMA for points and CalcImage for X-ray maps.
Automatic Alternating On/Off Peak Intensities
For extended acquisition times on major, minor or trace elements, use of the Alternating On and Off Peak Acquisition feature allows one to integrate the peak and background intensities by alternating the on and off-peak intensity acquisitions repeatedly and monitor long term trends in intensity changes over time.
- Automatically record both on and off-peak (alternating) intensity data.
- Display and export to ASCII file for external re-processing and plotting.
- These measurements are automatically integrated in the quantitative analysis as specified by the user.
